Emerging from Non-Contact Atomic Force Microscopy, Magnetic Force Microscopy (MFM) is a special technique developed for the study of magnetic materials and phenomena.

In MFM a magnetic tip is used to probe the magnetic field above the sample surface.MFM can reach lateral resolution of 50 nm and can sense forces (force gradients) in the order of 10 pN.

In order to improve the efficiency of MFM, Quartz Tuning Fork based MFM has been developed to avoid the weak points of cantilevers. Magnetic Dissipation Microscopy exploits dissipation phenomena while analytical techniques respond to the needs of the modern industry to work with high frequency magnetic fields (High Frequency MFM and Magnetoresistive Sensitivity Mapping i.e. MSM).

MFM is an important tool for the magnetic storage media industry, as well as for the semiconductor industry allowing quality evaluation and structural defect imaging.